Pages 1–37 from the book:

ToF-SIMS: Materials Analysis by Mass Spectrometry 2nd Edition

ISBN: 978-1-906715-18-2

Chapter 1. Prologue: ToF-SIMS—An evolving mass spectrometry of materials

John C. Vickerman

Chapter Summary: An introduction to the technique of and developments in time-of-flight secondary ion mass spectrometry (ToF-SIMS)