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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

ISBN: 978-1-901019-04-9

Perspectives on XPS and AES

David Briggs and John T. Grant

XPS: Basic Principles, Spectral Features and Qualitative Analysis

David Briggs

AES: Basic Principles, Spectral Features and Qualitative Analysis

John T. Grant

Specimen Preparation and Handling

Joseph Geller

XPS: Instrumentation and Performance

Ian W. Drummond

AES Instrumentation and Performance

Masato Kudo

Instrument Calibration for AES and XPS

Martin P. Seah

Analysing Insulators with XPS and AES

Michael A. Kelly

Beam Effects During AES and XPS Analysis

Don R. Bear, Dan J. Gaspar, Mark H. Engelhard and A.Scott Lea

Electron Transport in solids

Wolfgang S. M. Werner

Electron Attenuation Lengths

Shigeo Tanuma

Quantification of Nano-structures by Electron Spectroscopy

Sven Tougaard

Quantification in AES and XPS

Martin P. Seah

The Use of Chemometrics in AES and XPS Data Treatment

William F. Stickle

XPS Lineshapes and Curve Fitting

Neal Fairley

Chemical Effects in XPS

Laszlo KoÖver

Chemical Information from Auger Lineshapes

David E. Ramaker

The Auger Parameter

Giuliano Moretti

Valence Bands Studied by XPS

Peter M.A. Sherwood

Structural Effects in XPS and AES: Diffraction

J. Osterwalder

Electron Backscattering and Channelling

Ding Ze-jun and Ryuichi Shimizu,

Sputter Depth Profiling in AES and XPS

Thomas Wagner, Jiang Y. Wang and Siegfried Hofmann

Angle-Resolved X-Ray Photoelectron Spectroscopy

Peter J. Cumpson

XPS Imaging

Kateryna Artyushkova and Julia E. Fulghum

Processing, Interpretation and Quantification of Auger Images

Martin Prutton

X-ray Photoelectron Spectroscopy and Imaging at Synchrotrons

G. Margaritondo

Total reflection X-Ray Photoelectron Spectroscopy

Yoshitoki Lijima

Ion-Excited Auger Electron Spectroscopy

John T. Grant

Positron-Annihilation-Induced Auger electron Spectroscopy

Toshiyuki Ohdaira and Ryoichi Suzuki

Electron Coincidence Measurements

Stephen M. Thurgate

Recent Developments in the Theory of Auger Spectroscopy

Peter Weightman

Peak Positions from MG X-Rays and from Al X-Rays by Atomic Number

Peak Positions from Mg X-Rays and from Al X-Rays in Numerical Order

Auger Kinetic Energies and Sensitivity Factors by Atomic Number

Auger Kinetic Energies in Numerical Order

Polymer C 1s Chemical Shifts

Comparing Beam Damage Rates Using Susceptibility Tables

D.R. Baer, M.H Engelhard, A.S. Lea and D.J. Gaspar

Manufacturers of AES and XPS Systems

John T. Grant

Software for Processing AES and XPS Data

John T. Grant


John T. Grant

Measurement and Documentary Standards

John T. Grant

Internet Resources

John T. Grant