The winner of the Tomas Hirschfeld Award 2018 is Professor Christian Huck from the University of Innsbruck, Austria. Christian has developed several NIR-based applications in the field of Material Science, Bioanalysis, Medicinal Plants and Food Quality Control. He has written several milestone publications including the investigation of nanomaterials and rapid blood quality control. Christian has also developed techniques to use miniature NIR instruments to determine the optimum harvest time of medicinal plants as well as a technique to detect food fraud. In his spare time from all this, Christian has also been acting as Editor-in-Chief of NIR news and is on the Editorial Advisory Board of JSI—Journal of Spectral Imaging.
The award ceremony and award lecture will be organised at the International Diffuse Reflectance Conference (IDRC) between 29 July and 2 August 2018 at Wilson College, Chambersburg, PA, USA. The Tomas Hirschfeld Award is sponsored by Foss.
Congratulations Christian!